IEICE Electronics Express

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ONLINE ISSN:1349-2543

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Important Notice (April 25, 2017)

The article charge of IEICE Electronics Express (ELEX) will be revised on August 1st, 2017. The revised charge will be imposed on the manuscripts submitted after August 1st, 2017.
For details, click here.

Archives

Vol. 7 No. 18 September 25, 2010

Science and engineering for electronics

1329-1334 : LETTER

Improving dynamic texture recognition with constraint subspace learning

Tiesheng Wang, Pengfei Shi

 

Science and engineering for electronics

1335-1341 : LETTER

FPGA-based PWM for three-phase SEPIC rectifier

Siti Rohani S. Raihan, Nasrudin Abd. Rahim

 

Wireless circuits and devices

 

Integrated circuits

1349-1353 : LETTER

SSCG with Hershey-Kiss modulation profile using Dual Sigma-Delta modulators

Hyung-Min Park, Hyun-Bae Jin, Jin-Ku Kang

 

Science and engineering for electronics

1354-1358 : LETTER

Improvement of the error characteristics of N-continuous OFDM system by SLM

Masaya Ohta, Atsuo Iwase, Katsumi Yamashita

 

Microwave and millimeter wave devices, circuits, and systems

 

Integrated circuits

1364-1369 : LETTER

A unified solution to reduce test power and test volume for Test-per-scan schemes

Shaochong Lei, Zhen Wang, Zeye Liu, Feng Liang

 

Microwave and millimeter wave devices, circuits, and systems

1370-1375 : LETTER

Circular hook-shaped wireless USB dongle antenna with an open stub

Seong Jae Jeong, Keum Cheol Hwang

 

Integrated circuits

1376-1381 : LETTER

A new input matching technique for ultra wideband LNAs

Mohammad Sadegh Mehrjoo, Mohammad Yavari

 

Integrated circuits

1382-1387 : LETTER

Random numbers from an integrated CMOS double-scroll

Shuguo Li, Fuqiang Cao

 

Science and engineering for electronics

1388-1395 : LETTER

Outage probability of coded cooperation for slow fading channel

A. H. M. Almawgani, M. F. M. Salleh

 

Electron devices, circuits, and systems

 

Electronic instrumentation and control

 

Science and engineering for electronics

1409-1415 : LETTER

A wavelet-domain non-parametric statistical approach for image denoising

Jing Tian, Li Chen, Lihong Ma