IEICE Electronics Express

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ONLINE ISSN:1349-2543

J-tagemark

Important Notice (April 25, 2017)

The article charge of IEICE Electronics Express (ELEX) will be revised on August 1st, 2017. The revised charge will be imposed on the manuscripts submitted after August 1st, 2017.
For details, click here.

Archives

Vol. 2 No. 5 March 10, 2005

Integrated circuits

133-137 : LETTER

Voltage stress-induced performance degradation in NMOSFET mixer

C. Yu, H. Yang, E. Xiao, J. S. Yuan

 

Integrated circuits

138-142 : LETTER

Simple and systematic design of FA cell using K map

Kamal Kumar Sharma

 

Electron devices

143-148 : LETTER

Reduction of plasma-induced fluorine damage to P-HEMTs using x-ray emission

Hiroyuki Uchiyama, Takafumi Taniguchi, Takeshi Kikawa

 

Photonics devices, circuits, and systems

149-153 : LETTER

Performance analysis of IP traffic over a WDM ring network in the presence of crosstalk

Katrina D. Dambul, F. M. Abbou, H. T. Chuah

 

Photonics devices, circuits, and systems

154-158 : LETTER

New pumping scheme for high gain and low noise figure in an erbium-doped fiber amplifier

V. Sinivasagam, Mustafa A. G. Abushagur, K. Dimyati, F. Tumiran

 

Microwave and millimeter wave devices, circuits, and systems

 

New functional devices and materials

165-169 : LETTER

Equivalent material parameter extraction of double strip loaded waveguide

Rakhesh S. Kshetrimayum, Lei Zhu, K. J. Vinoy

 

Photonics devices, circuits, and systems

170-175 : LETTER

A wavelength-tunable short-cavity DBR laser with active distributed Bragg reflector

Hideo Arimoto, Hiroshi Sato, Takeshi Kitatani, Tomonobu Tsuchiya, Kazunori Shinoda, Aki Takei, Hiroyuki Uchiyama, Masahiro Aoki, Shinji Tsuji