IEICE Electronics Express

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ONLINE ISSN:1349-2543

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Important Notice (April 25, 2017)

The article charge of IEICE Electronics Express (ELEX) will be revised on August 1st, 2017. The revised charge will be imposed on the manuscripts submitted after August 1st, 2017.
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Archives

Vol. 4 No. 6 March 25, 2007

Electron devices

185-191 : LETTER

Carrier separation and Vth measurements of W-La2O3 gated MOSFET structures after electrical stress

Joel Molina, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai

 

Integrated circuits