IEICE Electronics Express

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ONLINE ISSN:1349-2543

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Important Notice (April 25, 2017)

The article charge of IEICE Electronics Express (ELEX) will be revised on August 1st, 2017. The revised charge will be imposed on the manuscripts submitted after August 1st, 2017.
For details, click here.

Archives

Vol. 2 No. 3 February 10, 2005

Integrated circuits

64-69 : LETTER

Power Valve: for low power operation and low stand-by power

Takahiro Yamashita, Tetsuya Fujimoto, Koichiro Ishibashi

 

Science and engineering for electronics

70-75 : LETTER

Enhanced pseudo Zernike moments in face recognition

Ying-Han Pang, Andrew Teoh B. J., David Ngo C. L.

 

Electron devices

76-80 : LETTER

On the fault tolerance of a clustered single-electron neural network for differential enhancement

Takahide Oya, Alexandre Schmid, Tetsuya Asai, Yusuf Leblebici, Yoshihito Amemiya

 

Electron devices

81-85 : LETTER

The effects of extended depletion region on noise modeling of HEMT's

Meena Mishra, R. Muralidharan, Harsh, S.S. Islam, Mukunda B. Das

 

Microwave and millimeter wave devices, circuits, and systems

 

Science and engineering for electronics

91-96 : LETTER

Fixed sign Walsh hardware structure

Bogdan J. Falkowski, Shixing Yan

 

Electron devices

97-102 : LETTER

Switching characteristics of SiC JFET and Schottky diode in high-temperature dc-dc power converters

Tsuyoshi Funaki, Juan C. Balda, Jeremy Junghans, Anuwat Jangwanitlert, Sharmila Mounce, Fred D. Barlow, H. Alan Mantooth, Tsunenobu Kimoto, Takashi Hikihara