IEICE Electronics Express

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ONLINE ISSN:1349-2543

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Important Notice (April 25, 2017)

The article charge of IEICE Electronics Express (ELEX) will be revised on August 1st, 2017. The revised charge will be imposed on the manuscripts submitted after August 1st, 2017.
For details, click here.

Archives

Vol. 6 No. 23 December 10, 2009

Electron devices, circuits, and systems

 

Integrated circuits

1626-1630 : LETTER

A novel hardware implementation of IDS method

Mahdi Tarkhan, Saeed Bagheri Shouraki, Seyed Hossein Khasteh

 

Science and engineering for electronics

1631-1637 : LETTER

Analysis on Supervised Neighborhood Preserving Embedding

Andrew Teoh B. J., Ying Han Pang

 

Science and engineering for electronics

 

Integrated circuits

 

Science and engineering for electronics

1649-1655 : LETTER

Reduced complexity optimum detector for Block Data Transmission Systems

SPK. Babu, M. F. M. Salleh, Farid Ghani

 

Integrated circuits

 

Integrated circuits

1663-1668 : LETTER

Bridge resistance deviation-to-period converter with high linearity

Won-Sup Chung, Chang-Su Won, Hoon Kim

 

Optoelectronics, Lasers and quantum electronics, Ultrafast optics, Silicon photonics, Planar lightwave circuits

1669-1675 : LETTER

Gigahertz-rate optical modulation on Mach-Zehnder PLZT electro-optic modulators formed on silicon substrates by aerosol deposition

Takanori Shimizu, Masafumi Nakada, Hiroki Tsuda, Hiroshi Miyazaki, Jun Akedo, Keishi Ohashi

 

Optoelectronics, Lasers and quantum electronics, Ultrafast optics, Silicon photonics, Planar lightwave circuits

1676-1682 : LETTER

Intense photoluminescence from erbium-doped tantalum oxide thin films deposited by sputtering

Mayank Kumar Singh, Genjoh Fusegi, Kazusa Kano, Jaspal Parganram Bange, Kenta Miura, Osamu Hanaizumi

 

Science and engineering for electronics

1683-1689 : LETTER

A novel active contour for medical image segmentation

Mahdi Saadatmand-Tarjzan, Hassan Ghassemian

 

Science and engineering for electronics

1690-1696 : LETTER

Random error estimation in refractive index measured with the terahertz time domain spectroscopy

Saroj R. Tripathi, Makoto Aoki, Kento Mochizuki, Toshiaki Asahi, Iwao Hosako, Norihisa Hiromoto

 

Electron devices, circuits, and systems

1697-1701 : LETTER

The influence of parasitic components on power MOSFET switching operation in power conversion circuits

Tsuyoshi Funaki, Hisato Arioka, Takashi Hikihara