IEICE Electronics Express

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ONLINE ISSN:1349-2543

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Important Notice (April 25, 2017)

The article charge of IEICE Electronics Express (ELEX) will be revised on August 1st, 2017. The revised charge will be imposed on the manuscripts submitted after August 1st, 2017.
For details, click here.

Archives

Vol. 13 No. 13

Electron devices, circuits, and systems

20160248 : LETTER

Temperature-dependent power-law model for submicron CMOS circuits EOS breakdown study

Yuan-Hung Tseng, Yu-Chia Chang, Xiao-Jing Wu

 

Electron devices, circuits, and systems

 

Integrated circuits

20160319 : LETTER

Study of a three-axis digital tunneling resistance-type magnetic sensor

Xiangyu Li, Liang Yin, Weiping Chen, Xiaowei Liu, Qiang Fu

 

Integrated circuits

20160447 : LETTER

An FPGA approach for high-performance multi-match priority encoder

Xuan-Thuan Nguyen, Hong-Thu Nguyen, Cong-Kha Pham

 

Power devices and circuits

 

Integrated circuits

20160457 : LETTER

A high performance with low harmonic distortion interface circuit of sigma-delta accelerometer

Xinpeng Di, Weiping Chen, Xiaowei Liu, Liang Yin, Qiang Fu

 

Microwave and millimeter-wave devices, circuits, and modules

 

Circuits and modules for storage

 

Integrated circuits

20160472 : LETTER

A UHF RFID chip solution with new oscillator calibration scheme and 16k bits EEPROM

Du Yongqian, Zhuang Yiqi, Li Xiaoming, Liu Weifeng

 

Electron devices, circuits and modules

20160480 : LETTER

QVCO frequency stability analysis using time varying root locus

Sohail Aneeb, Sanjeev Jain, Nikolay T. Tchamov

 

Integrated circuits

20160504 : LETTER

An ultra-long FFT architecture implemented in a reconfigurable application specified processor

Feng Han, Li Li, Kun Wang, Fan Feng, Hongbing Pan, Baoning Zhang, Guoqiang He, Jun Lin

 

Electron devices, circuits and modules

20160524 : LETTER

An efficient digital calibration technique for timing mismatch in time-interleaved ADCs

Chen Hongmei, Jian Maochen, Yin Yongsheng, Lin Fujiang, Cui Qing

 

Integrated circuits

20160533 : LETTER

Mitigate erroneous operations of 2T-2MTJ STT-MRAM based on dynamic voltage threshold

Haoyue Tang, Zhenyu Zhao, Lianhua Qu, Quan Deng, Huan Li, Wei Guo