IEICE Electronics Express

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ONLINE ISSN:1349-2543

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Important Notice (April 25, 2017)

The article charge of IEICE Electronics Express (ELEX) will be revised on August 1st, 2017. The revised charge will be imposed on the manuscripts submitted after August 1st, 2017.
For details, click here.

Archives

Vol. 14 No. 13

Microwave and millimeter-wave devices, circuits, and modules

 

Power devices and circuits

20170351 : LETTER

Robust digital deadbeat control design technique for 3 phase VSI with disturbance observer

Sohaib Tahir, Jie Wang, Ghulam Sarwar Kaloi, Mazhar Hussain Baloch

 

Circuits and modules for storage

20170385 : LETTER

A decoupled bit shifting technique using data encoding/decoding for DRAM redundancy repair

Kyu Hyun Choi, JaeYung Jun, Hokwon Kim, Seon Wook Kim, Youngsun Han

 

Integrated circuits

20170415 : LETTER

Reconfigurable scan architecture for test power and data volume reduction

Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang

 

Microwave and millimeter-wave devices, circuits, and modules

20170440 : LETTER

Efficient magnetic resonant coupling wireless power transfer with a novel conical-helix resonator

Yanyan Shi, Jie Liang, Meng Wang, Zhenyang Zhang

 

Integrated circuits

20170451 : LETTER

A 6-bit 38 GHz SiGe BiCMOS phase shifter for 5G phased array communications

Minghua Wang, Yu Liu, Zhiqiang Li, Xiaosong Wang, Muhamamad M Sarfraz, Yanbin Xiao, Haiying Zhang

 

Microwave and millimeter-wave devices, circuits, and modules

20170455 : LETTER

Ultra-wideband GaN HEMT power amplifier with practical mixed lumped approach employing real-frequency technique

Wen Jun Lim, Narendra Kumar, Siddik Yarman, Prakash Chacko

 

Power devices and circuits

20170461 : LETTER

A 1.3 V input fast-transient-response time digital low-dropout regulator with a VSSa generator for DVFS system

Young-Jae Min, Chan-Hui Jeong, Junil Moon, Youngsun Han, Soo-Won Kim, Chulwoo Kim

 

Integrated circuits

20170462 : LETTER

A novel power-efficient IC test scheme

Ding Deng, Xiaowen Chen, Yang Guo

 

Electron devices, circuits and modules

20170474 : LETTER

Understanding the influence of RESET current due to the active region of phase change memory

Yuchan Wang, Yueqing Wang, Xiaogang Chen, Xiaoyun Li

 

Microwave and millimeter-wave devices, circuits, and modules

 

Microwave and millimeter-wave devices, circuits, and modules

 

Power devices and circuits

 

Integrated circuits

20170502 : LETTER

A novel test data compression approach based on bit reversion

Shuo Cai, Yinbo Zhou, Peng Liu, Fei Yu, Wei Wang

 

Microwave and millimeter-wave devices, circuits, and modules

20170510 : LETTER

A feasible bandwidth compensation technique for FSS radome design

Ning Liu, Xianjun Sheng, Chunbo Zhang, Jingjing Fan, Dongming Guo

 

Microwave and millimeter-wave devices, circuits, and modules

20170518 : LETTER

A dual-band fractal FSS with SZ curve elements

Xianjun Sheng, Jingjing Fan, Ning Liu, Chunbo Zhang

 

Integrated circuits

20170570 : LETTER

Improved stacked-diode ESD protection in nanoscale CMOS technology

Chun-Yu Lin, Meng-Ting Lin