IEICE Electronics Express

  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner
  • Fieldbanner

ONLINE ISSN:1349-2543

J-tagemark

Important Notice (April 25, 2017)

The article charge of IEICE Electronics Express (ELEX) will be revised on August 1st, 2017. The revised charge will be imposed on the manuscripts submitted after August 1st, 2017.
For details, click here.

Archives

Vol. 3 No. 16 August 25, 2006

Electron devices

379-384 : LETTER

Characterization of punch-through phenomenon in SiC-SBD by capacitance-voltage measurement at high reverse bias voltage

Tsuyoshi Funaki, Shuntaro Matsuzaki, Tsunenobu Kimoto, Takashi Hikihara

 

Microwave and millimeter wave devices, circuits, and systems